发明名称
摘要 An interconnect system that has low alpha particle emission characteristics for use in an electronic device includes a semiconductor chip that has an upper surface and spaced apart electrically resistive bumps positioned on conductive regions of the upper surface, the electrically resistive bumps are made of a composite material of a polymer and metal particles, and a substrate that has conductive regions bonded to the electrically resistive bumps in a bonding process wherein the electrically resistive bumps convert to electrically conductive bumps after the bonding process.
申请公布号 JP3177195(B2) 申请公布日期 2001.06.18
申请号 JP19970207589 申请日期 1997.08.01
申请人 发明人
分类号 H01L21/60;H01L23/556;H05K1/18;H05K3/24;H05K3/32;H05K3/34;(IPC1-7):H01L21/60 主分类号 H01L21/60
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