发明名称 METHOD FOR MANUFACTURING PLANARIZATION LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a planarization layer of a semiconductor device is provided to forming the planarization layer having no void, by depositing a planarization layer, by etching a part of the upper portion of the evaporated planarization layer to make a portion between stepped regions of the planarization layer have a gentle slope, and by depositing another planarization layer. CONSTITUTION: The first planarization layer is deposited on a substrate(1) having a semiconductor device. A part of the upper portion of the first planarization layer is etched to make a portion between stepped regions of the first planarization layer have a gentle slope. The second planarization layer is deposited on the first planarization layer of which a part of the upper portion is etched.
申请公布号 KR20010048672(A) 申请公布日期 2001.06.15
申请号 KR19990053455 申请日期 1999.11.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 OH, JAE SEOP
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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