发明名称 METHOD FOR CONTROLLING THE TRANSFER OF SEMICONDUCTOR WAFER
摘要 PURPOSE: A method for controlling the transfer of a semiconductor wafer is provided to control a SEMICONDUCTOR wafer transferred to a chemical bath in order to minimize fine water drops. CONSTITUTION: A method for controlling the transfer of a semiconductor wafer consists of the following steps; descending the semiconductor wafer on top of a chemical bath that is filled with the chemicals and stopping in the position adjacent to the surface of the chemicals; descending the semiconductor wafer of the position adjacent to the surface of the chemicals and stopping in the position soaked above the chemicals; descending the semiconductor wafer of the position soaked above the chemicals and stopping in the position entirely soaked in the chemicals; descending the semiconductor wafer of the position entirely soaked in the chemicals and stopping in the predetermined stop position.
申请公布号 KR20010046788(A) 申请公布日期 2001.06.15
申请号 KR19990050692 申请日期 1999.11.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JU, JAE DONG;KANG, NEUNG SEOK
分类号 H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/68
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