发明名称 |
METHOD FOR CONTROLLING THE TRANSFER OF SEMICONDUCTOR WAFER |
摘要 |
PURPOSE: A method for controlling the transfer of a semiconductor wafer is provided to control a SEMICONDUCTOR wafer transferred to a chemical bath in order to minimize fine water drops. CONSTITUTION: A method for controlling the transfer of a semiconductor wafer consists of the following steps; descending the semiconductor wafer on top of a chemical bath that is filled with the chemicals and stopping in the position adjacent to the surface of the chemicals; descending the semiconductor wafer of the position adjacent to the surface of the chemicals and stopping in the position soaked above the chemicals; descending the semiconductor wafer of the position soaked above the chemicals and stopping in the position entirely soaked in the chemicals; descending the semiconductor wafer of the position entirely soaked in the chemicals and stopping in the predetermined stop position.
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申请公布号 |
KR20010046788(A) |
申请公布日期 |
2001.06.15 |
申请号 |
KR19990050692 |
申请日期 |
1999.11.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JU, JAE DONG;KANG, NEUNG SEOK |
分类号 |
H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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