| 摘要 |
PURPOSE: A semiconductor testing system based on event is provided to efficiently test a device to be tested. CONSTITUTION: The even type testing system includes an event memory(30) storing respective even timing data constituted of an integer multiple of a reference clock period and a fractional part of the reference clock period, an address sequencer(28) accessing the even memory and forming address data for reading timing data, a timing count logic(33) forming an event start signal delayed by a time found by multiplying the reference clock by the integral part data, an event generation unit(34) forming a test signal and a strobe signal on the basis of the event start signal from the timing count logic and the fractional part data from the event memory(30), and a host computer(22) controlling the event type test system as a whole according to a test program.
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