| 发明名称 |
METHOD FOR QUALITY CONTROL OF MATERIAL LAYERS |
| 摘要 |
The invention relates to a method for the quality control of material layers (7), whereby the surface of the layer is irradiated with electromagnetic radiation (8) and the amount of light (9) emitted by the material layer by, for example, reflected radiation or fluorescent radiation is determined, the material of the layer having been provided with an agent for absorbing the radiation.
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| 申请公布号 |
WO0142772(A1) |
申请公布日期 |
2001.06.14 |
| 申请号 |
WO2000EP12105 |
申请日期 |
2000.12.01 |
| 申请人 |
INSTITUT FUER CHEMO- UND BIOSENSORIK MUENSTER E.V.;BORCHARDT, MICHAEL;WENDZINSKI, FRANK;EIKERMANN, DORTHE |
发明人 |
BORCHARDT, MICHAEL;WENDZINSKI, FRANK;EIKERMANN, DORTHE |
| 分类号 |
G01B11/06;G01B11/30;G01N21/88;G01N21/91;(IPC1-7):G01N21/91 |
主分类号 |
G01B11/06 |
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