发明名称 MODULE RAM MOUNTING TEST HANDLER AND MODULE RAM TESTING METHOD USING THE SAME
摘要 PURPOSE: A module RAM mounting test handler and a method RAM testing method using the handler are provided which uses a mother board on which a module RAM will be mounted to check if there is an abnormal state in the module RAM while the module RAM is being mounted on the mother board. CONSTITUTION: A module RAM mounting test handler includes a loading unit(2), the first test unit(3), a buffer(4), the second test unit(6), the first unloading unit(7), and the second unloading unit(8). The loading unit loads a tray accommodating a plurality of module RAMs. The first test unit receives the module RAMs on the tray to check the module RAMs. The buffer receives the module RAMs classified according to the checked states to temporarily store the module RAMs. The second test unit receives only the module RAMs being in a satisfactory state to mount the module RAMs on a mother board and checks if there is an abnormal state of the module RAMs. The first unloading unit unloads only the module RAMs without fault into an empty tray. The second unloading unit unloads only the module RAMs having fault into an empty tray.
申请公布号 KR20010049215(A) 申请公布日期 2001.06.15
申请号 KR20000009154 申请日期 2000.02.24
申请人 MIRAE CORPORATION 发明人 KIM, DU CHEOL;LEE, GI HYEON
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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