发明名称 Device for detecting surface quality of material transported on conveyor subjects surface of material to pressurized gas, detects/assesses surface quality of resulting local surface deformations
摘要 The device has a nozzle (2) that subjects the surface of the material (4) being transported to pressurized gas and an arrangement for detecting or assessing the surface quality of the resulting local deformations of the surface of the material being transported. An optical arrangement, preferably a camera, or a distance sensor is used to detect the deformations. Independent claims are also included for the following: a method of detecting the surface quality of a material being transported on a conveyor.
申请公布号 DE19959198(A1) 申请公布日期 2001.06.13
申请号 DE19991059198 申请日期 1999.12.08
申请人 ABB PATENT GMBH 发明人 GUTERMUTH, GEORG;BAIER, MICHAEL
分类号 B07C5/34;G01B13/24;(IPC1-7):G01B13/22;G01B17/04 主分类号 B07C5/34
代理机构 代理人
主权项
地址