发明名称 Radiation hardened MOS transistors
摘要 <p>N+ type gate region (2), drain region (3) and source region (4) are formed on a grounded P+ type substrate (10). N+ type buried layer (6) is extended under drain region and connected to gate region through a diode (8). An Independent claim is also included for SRAM cell.</p>
申请公布号 EP1107314(A1) 申请公布日期 2001.06.13
申请号 EP20000410153 申请日期 2000.12.08
申请人 STMICROELECTRONICS S.A. 发明人 ROCHE, PHILIPPE
分类号 H01L27/02;H01L27/11;(IPC1-7):H01L27/11 主分类号 H01L27/02
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