发明名称 CELL BLOCK SELECTION DECODER OF MEMORY
摘要 PURPOSE: A cell block selection decoder of a memory is provided to reduce a layout area by making a decoder size different according to a position of a cell block, and reduce a current. CONSTITUTION: A cell block selector(300) receives a predetermined address signal, and generates a selection signal. A cell core(400) includes a cell block that is enabled by a selection signal of the cell block selector, and inputs/outputs a predetermined data according to a word line control signal, a sense signal and a write control signal. The selector includes an inverter. The inverter(INV20-INV35) includes NAND gate(N0-N15) and NMOS transistor(NM). The NAND gate(N0-N15) has a big size in proportion to a driving distance, and performs NAND operation to a predetermined address. The NMOS transistor(NM) is connected in parallel to PMOS transistor(PM) that receives a low potential output signal of the NAND gate(N0-N15) through its own gate and applies a power voltage to an output terminal. Here, the NMOS transistor(NM) is sequentially connected to the PMOS transistor(PM) in proportion to a driving distance. The NMOS transistor(NM) receives a high potential output signal of the NAND gate(N0-N15) to the contact point through its own gate, and outputs ground voltage to an output terminal.
申请公布号 KR100300043(B1) 申请公布日期 2001.06.13
申请号 KR19980014917 申请日期 1998.04.27
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 CHUN, BONG JAE;LEE, JUNG YONG
分类号 G11C11/407;(IPC1-7):G11C11/407 主分类号 G11C11/407
代理机构 代理人
主权项
地址