发明名称 Method and device for measuring axial deviation in a taut wire alignment system
摘要 A method for measuring axial deviation in a taut-wire alignment system (1) that includes a dynamically grounded resistive wire (2) extending along a longitudinal reference axis and adjacent to elements to be aligned (3). The method comprises applying an AC voltage signal to a measurement electrode provided with a reference electrode, the measurement electrode being arranged in a measurement plane in a holder attached to an element to be aligned (3); carrying out a measurement using a capacitive bridge that includes a first capacitor consisting of the measurement electrode and the wire, as well as a second capacitor, in order to provide a measurement signal representing an axial position of the measurement electrode relative to the taut wire (2) ; and processing the measurement signal to provide data indicating the axial deviation between the element to be aligned (3, 7) and a predetermined alignment position. The method is particularly suitable for aligning elements in linear colliders.
申请公布号 US6246244(B1) 申请公布日期 2001.06.12
申请号 US19980068518 申请日期 1998.05.11
申请人 NANOTEC SOLUTION 发明人 LETEURTRE PATRICK;OSSART FRéDéRIC
分类号 G01C15/00;G01B7/31;(IPC1-7):G01R27/26 主分类号 G01C15/00
代理机构 代理人
主权项
地址