发明名称 Method of producing semiconductor device with heat dissipation metal layer and metal projections
摘要 A method of producing a semiconductor device having a heat dissipating metal layer wherein the number of patterning steps is reduced, laser dicing produces a better profile, and first and second metal layers are prevented from separating from each other, and a semiconductor device produced by the method. The number of patterning steps is reduced by employing a flat exposure step for photoresist with mask alignment. A better appearance is obtained by forming the metal layers which connect the semiconductor devices with each other from a first metal layer having a lower melting point and a second metal layer having a higher melting point and severing the first metal layer and the second metal layer successively, from the first metal layer side. A second metal layer is prevented from peeling by preventing oxidation of the plated feeder layer through plating of the second metal layer.
申请公布号 US6245596(B1) 申请公布日期 2001.06.12
申请号 US19990427584 申请日期 1999.10.27
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KOSAKI KATSUYA;TAMAKI MASAHIRO;MATSUOKA HIROSHI
分类号 B23K26/00;B23K26/40;H01L21/301;H01L21/304;H01L21/78;H01L23/367;(IPC1-7):H01L23/24 主分类号 B23K26/00
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