发明名称 System and method of optically inspecting manufactured devices
摘要 An apparatus, system, and method of optically inspecting printed circuit boards (PCBs) for defects, that reliably determines the dimensions of components including those having the same color as the background, and which can detect components which are missing, misoriented, misaligned, or not properly seated. The apparatus uses a camera and a coherent primary light source mounted at an angle away from the vertical so as to produce sharply defined PCB component shadows on the top surface of the PCB. An image of the PCB is captured, the shadow edges are symbolically decomposed into primitives from which gradients are produced, and then compared to a previously captured gradient of a defect-free PCB. Differences in the two image gradients, if any, are used to identify missing, misaligned, misoriented, and improperly seated components, and to detect foreign objects and other PCB defects.
申请公布号 US6246788(B1) 申请公布日期 2001.06.12
申请号 US19980074301 申请日期 1998.05.06
申请人 ISOA, INC. 发明人 PATTIKONDA RAMAKRISHNA;LIN YOULING;HENNESSEY KATHLEEN
分类号 G01N21/95;G06T7/00;H01L21/66;(IPC1-7):G06K9/00 主分类号 G01N21/95
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