发明名称 DEVICE AND METHOD FOR TESTING DROP
摘要 PURPOSE: A device and method for testing drop are provided to automatically perform a drop test by exactly controlling the direction of the drop through a first rotation driving unit, a second rotation driving unit and a z-axis driving unit. CONSTITUTION: A vacuum absorption pad(11) drops a sample(10) by absorbing or releasing the absorption. A first rotation driving unit(13) rotates the vacuum absorbing pad around a shaft(12) to optionally control the drop status of the sample. A second rotation driving unit(15) rotates an operating lever(14) having the vacuum absorbing pad and the first rotation driving unit to control a drop angle and a drop status of the sample. A z-axis driving unit(17) lifts a supporting lever(16) having the vacuum absorbing pad, the first rotation driving unit and the second rotation driving unit to grip and to drop the sample. A first cylinder(19) pushes the sample from the back of a frame(18) to the center through a pushing piece(20). A second cylinder(21) pushes the sample from the left of the frame to the center through a pushing piece(22). A third cylinder(23) pushes the sample from the right of the frame to the center through a pushing piece(24). A controller(25) outputs a control signal to sequentially control the operations of the first and the second rotation driving unit, the z-axis driving unit, the first to the third cylinders and the vacuum absorbing pad for continuously and automatically performing the drop test according to the input of a start key(27). Thereby, the continuous drop test is performed automatically.
申请公布号 KR100299829(B1) 申请公布日期 2001.06.12
申请号 KR19970059696 申请日期 1997.11.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, DU SONG
分类号 G01M7/08;(IPC1-7):G01M7/08 主分类号 G01M7/08
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