发明名称 Stress relieve pattern for damascene process
摘要 A new method is provided for the creation of interfacing and adjacent surfaces when creating damascene interconnects. Under the first embodiment of the invention, the surface area of the Intra Metal Dielectric (IMD) in which the copper metal pattern has been created is partially removed thereby reducing and sub-dividing the surface area of the interfacing surface. Under the second embodiment of the invention, the surface area of the IMD is sub-divided into a multiplicity of squares that now form the interfacing surface area. Under the third embodiment of the invention, the surface area of the Intra Metal Dielectric (IMD) in which the copper metal pattern has been created is essentially removed leaving sidewalls of the IMD material on the formed pattern of copper interconnects.
申请公布号 US6245683(B1) 申请公布日期 2001.06.12
申请号 US19990473028 申请日期 1999.12.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY 发明人 LIU CHIN-KAI
分类号 H01L21/314;H01L21/768;(IPC1-7):H01L21/311 主分类号 H01L21/314
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