发明名称 |
Negative voltage generating circuit with high control responsiveness which can be formed using transistor with low breakdown voltage and semiconductor memory device including the same |
摘要 |
A voltage generating circuit of the present invention includes a charge pump regulator and a voltage converting circuit. Charge pump regulator receives Ext.Vcc and a ground voltage as inputs and outputs a negative voltage Vbb1. Charge pump regulator receives Int.Vcc and negative voltage Vbb1 as inputs and outputs negative voltage Vbb2(<Vbb1). Voltage converting circuit receives Int.Vcc and negative voltage Vbb2 as inputs and outputs an output voltage Vnn. In each of charge pump regulator, a voltage difference between the input and the output is designed such that it is equal to or lower than a prescribed value determined by a size of a transistor.
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申请公布号 |
US6246280(B1) |
申请公布日期 |
2001.06.12 |
申请号 |
US19990321884 |
申请日期 |
1999.05.28 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
MORISHITA FUKASHI |
分类号 |
G11C11/413;G11C5/14;G11C11/407;G11C11/4074;G11C16/06;H02M3/07;(IPC1-7):G05F1/10;G11C7/00 |
主分类号 |
G11C11/413 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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