发明名称 Reticle for an object measurement system
摘要 A reticle for an object measurement system comprises a pattern 10 having a plurality of pairs of contrasting elements in the form of black (11', 11'' . . . 14'14'') and white (21 . . . 24) wedges. Each black/white wedge pair defines a path towards a pattern origin 19 such that an edge of an object 50 occluding the path causes a change in contrast adjacent an edge point along the path. The pattern has a series of Gray-coded elements 15 associated with each pair of black/white wedges. The Gray-coded elements are indicative of an absolute coordinate of each edge point at which an object edge crosses a path. A series of triangles 16 associated with each pair of black/white wedges, whose absolute coordinates are known, allow a measurement system to provide accurate coordinates for each edge point.
申请公布号 US6246478(B1) 申请公布日期 2001.06.12
申请号 US19990318170 申请日期 1999.05.25
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHAPMAN SYDNEY GEORGE;WALTER ANDREW GORDON NEIL
分类号 G01B3/00;G01B11/02;H03M1/24;(IPC1-7):G01B11/00 主分类号 G01B3/00
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