发明名称 DC MEASURING CIRCUIT FOR IC TESTER
摘要 PROBLEM TO BE SOLVED: To provide a protective circuit for protecting a guard buffer connected to a guard line in a DC measuring circuit for an IC tester. SOLUTION: With forward direction voltage of diodes D1-D4 in a guard buffer protective circuit 8 being VF, when the relationship between power-source voltages VA and VB and an external voltage VG is VB<VG, a forward- direction current (VG-VF-VB)/R2 flows in the diode D4, so that the output voltage of a voltage amplifier 5 which is a guard buffer is kept at VS=VO. If VA>VG, the forward-direction current (VA-VF-VG)/R1 flows in the diode D2 so that the output voltage of the voltage amplifier 5 which is a guard buffer is kept at VS=VO.
申请公布号 JP2001159659(A) 申请公布日期 2001.06.12
申请号 JP19990341259 申请日期 1999.11.30
申请人 ANDO ELECTRIC CO LTD 发明人 KUMAKI TAMOTSU;MURAMATSU EIICHI
分类号 G01R31/26;G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/26
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