| 摘要 |
PROBLEM TO BE SOLVED: To shorten the test time by testing a plurality of circuits at the same time. SOLUTION: A semiconductor integrated circuit comprising a test circuit for testing a plurality of logical circuits comprises a selector for selectively transferring the output signals of the logical circuits, a comparator circuit for comparing the output signals of the logical circuits, and an output buffer circuit which controls transfer of the output signal of selector in response to the output signal of the comparator circuit.
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