INTEGRATED CIRCUIT COMPRISING TEST CIRCUIT AND TEST METHOD FOR IT

摘要

PROBLEM TO BE SOLVED: To provide a test means for an integrated circuit which dynamically specifies a trigger condition and sampling timing. SOLUTION: An integrated circuit 100 comprises a target circuit 102 and a test circuit 104. The target circuit 103 uses a clock signal 101 to transfer a target signal 103 in the integrated circuit 100. The test circuit 104 samples the target signal 103 at a timing selected among a plurality of possible timings in the clock cycle of the lock signal 101. The test circuit 104 samples the target signal 103 in response to a test signal 105 representing the selected timing.