发明名称 |
Method and apparatus for testing semiconductor memory device having a plurality of memory banks |
摘要 |
A method and apparatus for testing a semiconductor memory device having a plurality of memory banks are provided. Virtual addresses for differentiating the respective memory cell arrays are generated in the semiconductor memory device. The data stored in the memory cells of physical addresses is sequentially read according to the virtual addresses. Thus, it is possible to know the memory cell array to which a defective memory cell belongs.
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申请公布号 |
US6247153(B1) |
申请公布日期 |
2001.06.12 |
申请号 |
US19990295179 |
申请日期 |
1999.04.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEON SOON-KEUN;KANG SANG-SOO |
分类号 |
G01R31/28;G11C29/56;(IPC1-7):G11C29/00;G11C7/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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