发明名称 Methods and apparatus for troubleshooting scaleable multislice imaging system
摘要 The present invention, in one form, is an imaging system which, in one embodiment, alters the configuration of a detector array and a data acquisition system to determine degraded component performance and generate fault isolation information. More specifically, by altering the configuration to include different combinations of detector array cells, interconnections, and one or more data acquisition channels, fault isolation information is generated.
申请公布号 US6246743(B1) 申请公布日期 2001.06.12
申请号 US19980140290 申请日期 1998.08.25
申请人 GENERAL ELECTRIC COMPANY 发明人 KOPP, III RUDOLPH T.;HE HUI DAVID;SEIDENSCHNUR GEORGE E.;SCHANEN PAUL C.
分类号 A61B6/03;(IPC1-7):G01N23/00 主分类号 A61B6/03
代理机构 代理人
主权项
地址