发明名称 METHOD FOR PRODUCING OXIDE THIN FILM, METHOD FOR PRODUCING MEMORY ELEMENT, METHOD FOR PRODUCING PIEZOELECTRIC ELEMENT AND OXIDE THIN FILM, MEMORY ELEMENT AND PIEZOELECTRIC ELEMENT PRODUCED BY THESE PRODUCTION METHODS
摘要 PROBLEM TO BE SOLVED: To provide a method for producing an oxide thin film capable of easily giving fine crystals, provide a method for producing a memory element or a piezoelectric element using the thin film production method and provide an oxide thin film, a memory element and a piezoelectric element produced by these methods. SOLUTION: A solution of an organometallic compound containing an oxide- forming metal element is used as a starting raw material and the solution is applied to a substrate, dried, calcined and subjected to main baking to form an oxide thin film. In the above process, the calcination is carried out in an atmosphere inert to the organometallic compound. Nitrogen atmosphere is especially preferable as the inert atmosphere. A memory element or a piezoelectric element is produced by using the method for the production of the oxide thin film.
申请公布号 JP2001158607(A) 申请公布日期 2001.06.12
申请号 JP19990343439 申请日期 1999.12.02
申请人 SEIKO EPSON CORP 发明人 KARASAWA JUNICHI;NATORI EIJI
分类号 C01B13/32;C01G25/00;H01L21/336;H01L21/8246;H01L21/8247;H01L27/10;H01L27/105;H01L29/788;H01L29/792;H01L41/09;H01L41/22;H01L41/317;H01L41/318;H01L41/39;H01L41/43 主分类号 C01B13/32
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