发明名称 |
Method of manufacturing a split-gate flash memory cell with polysilicon spacers |
摘要 |
A method of manufacturing a self-aligned split-gate flash memory cell with high coupling ratio is disclosed. A polysilicon spacer is first formed on each of the inner walls between the two select gates on which a dielectric layer is formed. A drain and a source are next formed adjacent to each of the outer walls of the two select gates and between the two polysilicon spacers, respectively. A silicon oxide layer is deposited. A predetermined thickness of the silicon oxide layer is then removed and the dielectric layer is removed down to a predetermined thickness by using a dry etching process. Finally, a control gate is formed above the polysilicon spacers.
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申请公布号 |
US6245614(B1) |
申请公布日期 |
2001.06.12 |
申请号 |
US20000597745 |
申请日期 |
2000.06.19 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
HSIEH TSONG-MINN |
分类号 |
H01L21/8247;H01L27/115;H01L29/423;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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