| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester and an IC testing method which make it possible to perform frequency analysis only by current variation by the use of a test pattern signal more easily, without changing a pattern signal to be inputted. SOLUTION: A controlling processor 1 causes a memory circuit 21 to store the address starting source current, and causes a memory circuit 22 to store the address of finishing the source current. Coincidence detector circuits 23, 24 set a flip-flop 6, when a pattern generation address signal inputted from a pattern generator 2 coincides with the address signal of the getting start of the source current, and resets the flip-flop 6, when it coincides with the address signal of the getting finish of the source current. An AND gate 7 outputs a clock signal to an analog-to-digital converter 8, only while the flip-flop 6 is set, and the alalog-to-digital converter 8 converts a current signal to a digital signal, and outputs it to a memory circuit 9.
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