发明名称 PROCEDE DE DETECTION DE DEFAUT POUR CIRCUIT ELECTRONIQUE
摘要 A method and device for detecting faults in an electronic circuit, such as a multiplexed latch includes n control inputs, p data inputs, and at least one output. The method involves trying to cause the electronic circuit to function to modify the state of the output with respect to a start state, knowing that if the state of the output effectively changes while the control inputs are inhibited, this means that at least one control input is stuck at logic 1.
申请公布号 FR2792730(B1) 申请公布日期 2001.06.08
申请号 FR19990004984 申请日期 1999.04.20
申请人 STMICROELECTRONICS SA 发明人 AYRIGNAC RENAUD
分类号 G01R31/3185;(IPC1-7):G01R31/28 主分类号 G01R31/3185
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