发明名称 MIXED ACID LIQUID IN ETCHING AND ETCHING CONTROL METHOD
摘要 PROBLEM TO BE SOLVED: To provide a mixed acid liquid in etching which is suitably used for planarizing a semiconductor wafer or improving its glossiness required for the wafer. SOLUTION: The mixed acid liquid contains hydrofluoric acid, phosphoric acid, nitric acid and fluorophosphoric acid and has a fluorophosphoric acid concentration of 3-15 wt.%. In a preferred embodiment, the hydrofluoric acid concentration is 5-12 wt.%, the phosphoric acid concentration is 15-40 wt.% and the nitric acid concentration is 25-40 wt.%.
申请公布号 JP2001156052(A) 申请公布日期 2001.06.08
申请号 JP19990334897 申请日期 1999.11.25
申请人 NIPPON KASEI CHEM CO LTD 发明人 SAWADA SATORO;OZAWA SHUICHI;YACHI FUMIE
分类号 H01L21/308;C09K13/08;H01L21/306;(IPC1-7):H01L21/308 主分类号 H01L21/308
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