发明名称 |
SEMICONDUCTOR LASER ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor layer element, in which an end face is difficult to deteriorate and which has high reliability on driving. SOLUTION: An Al2O3 film having a stoichiometric composition of resistivity of 1×1012Ω.m or more, preferably 1×1013Ω.m or more is used as a low reflecting film 18 coated and formed to one of the end faces of a resonator in the semiconductor laser element. The Al2O3 film is formed particularly by an electron cyclotron resonance plasma sputtering method. The semiconductor laser element being proper for usage as a light source for optical communication and having a long operation lifetime is realized by inhibiting the lowering of an optical output in the case of driving by a constant current by suppressing the deterioration of an end face.
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申请公布号 |
JP2001156383(A) |
申请公布日期 |
2001.06.08 |
申请号 |
JP20000268696 |
申请日期 |
2000.09.05 |
申请人 |
FURUKAWA ELECTRIC CO LTD:THE |
发明人 |
KAYA HIDESUKE;NINOMIYA TAKAO;OKUBO NORIO;UCHIYAMA SEIJI |
分类号 |
H01S5/028;(IPC1-7):H01S5/028 |
主分类号 |
H01S5/028 |
代理机构 |
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主权项 |
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地址 |
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