发明名称 METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which has a manufacturing process capable of forming a silicon oxide film at a low temperature. SOLUTION: In the manufacturing process capable of forming a silicon oxide film at a low temperature, the silicon oxide film is formed by the thermal CVD method using bis-tertiary butylaminosilane and O2 as raw material gases.
申请公布号 JP2001156063(A) 申请公布日期 2001.06.08
申请号 JP19990333292 申请日期 1999.11.24
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 MIZUNO KANEKAZU;MAEDA KIYOHIKO
分类号 H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/316
代理机构 代理人
主权项
地址