发明名称 |
METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which has a manufacturing process capable of forming a silicon oxide film at a low temperature. SOLUTION: In the manufacturing process capable of forming a silicon oxide film at a low temperature, the silicon oxide film is formed by the thermal CVD method using bis-tertiary butylaminosilane and O2 as raw material gases.
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申请公布号 |
JP2001156063(A) |
申请公布日期 |
2001.06.08 |
申请号 |
JP19990333292 |
申请日期 |
1999.11.24 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
MIZUNO KANEKAZU;MAEDA KIYOHIKO |
分类号 |
H01L21/316;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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