发明名称 LOADING STATE INSPECTING DEVICE AND LOADING STATE INSPECTING METHOD FOR ELECTRONIC PART
摘要 PROBLEM TO BE SOLVED: To provide a loading state inspecting device and a loading state inspecting method for an electronic part which are excellent in operability and inspection function. SOLUTION: In this loading state inspecting method for inspecting the loading state of an electronic part borne on a substrate, from a color image data obtained by a camera 5, a desired color is extracted using a color extract filter by a color extract part 25 to obtain a color extract image, and according to the color extract image, the loading state of the electronic part is inspected by a part loading state inspecting part 24. The color extract filter is set by an overall control part 26 by reading the data related to the color extract filter from a library storing part 12b according to the discriminating information of the electronic part. Thus, it is not necessary to set the color extract filter by teaching every time the kind of an electronic part as an inspection object is switched so as to effect a loading state inspecting device for an electronic part excellent in operability and inspecting function.
申请公布号 JP2001153627(A) 申请公布日期 2001.06.08
申请号 JP19990337139 申请日期 1999.11.29
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YANO KEIJI
分类号 H05K13/08;G01B11/24;G01J3/50 主分类号 H05K13/08
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