发明名称 |
SILICON SUBSTRATE AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a high accuracy through-hole that is formed in an insulating layer of a silicon substrate and a method for etching with high accuracy for obtaining it. SOLUTION: A magnetic layer comprising 3d metal is interposed between insulating layer and an Au conductor layer that stops etching. The insulating layer and the magnetic layer are removed simultaneously by etching, while magnetic properties of the overall silicon substrate is measured, to detect the end point of etching.
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申请公布号 |
JP2001156037(A) |
申请公布日期 |
2001.06.08 |
申请号 |
JP19990338079 |
申请日期 |
1999.11.29 |
申请人 |
TOKIN CORP |
发明人 |
SUGAWARA HIDEKUNI;SUZUKI HIDEO |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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