发明名称 SILICON SUBSTRATE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a high accuracy through-hole that is formed in an insulating layer of a silicon substrate and a method for etching with high accuracy for obtaining it. SOLUTION: A magnetic layer comprising 3d metal is interposed between insulating layer and an Au conductor layer that stops etching. The insulating layer and the magnetic layer are removed simultaneously by etching, while magnetic properties of the overall silicon substrate is measured, to detect the end point of etching.
申请公布号 JP2001156037(A) 申请公布日期 2001.06.08
申请号 JP19990338079 申请日期 1999.11.29
申请人 TOKIN CORP 发明人 SUGAWARA HIDEKUNI;SUZUKI HIDEO
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
代理机构 代理人
主权项
地址