| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device in which verify-test time or the like are shortened and increment of the number of exclusive terminals for test is suppressed, in a semiconductor device provided with a non-volatile semiconductor memory. SOLUTION: This device is provided with plural non-volatile memory blocks in which data can be electrically erased and written, and plural verify-circuits provided corresponding to each memory block of the plural memory blocks and deciding whether read-out data from the memory block coincides with expected value data inputted from an external terminal or not, decided results outputted from plural verify-circuits are outputted from the external terminal, the verify-circuit is provided with plural coincidence deciding circuit comparing data outputted from the memory blocks for deciding whether they are coincident with bit corresponding to expected data or not, and an OR circuit outputting a fail signal when output of plural coincidence deciding circuits are inputted and any one of them is non-coincidence.</p> |
