发明名称 Method for reducing particles from an electrostatic chuck and an equipment for manufacturing a semiconductor
摘要 A method for reducing particles from an electrostatic chuck, having the steps of: setting a wafer onto an attracting face of an electrostatic chuck, attracting the wafer onto the attracting face by applying a voltage to the electrostatic chuck, releasing stress due to a difference in heat expansion between the wafer and the electrostatic chuck by sliding the wafer relative to the attracting face before the wafer's temperature arrives at a saturated temperature, and increasing the wafer's temperature to a saturated temperature from its lower temperature than that of the attracting face.
申请公布号 US2001002871(A1) 申请公布日期 2001.06.07
申请号 US20010769519 申请日期 2001.01.26
申请人 NGK INSULATORS, LTD. 发明人 NAGAO MIE;USHIKOSHI RYUSUKE;OHNO MASASHI
分类号 B23Q3/15;G03F7/20;H01L21/027;H01L21/68;H01L21/683;H02N13/00;(IPC1-7):H02N13/00 主分类号 B23Q3/15
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