发明名称 Semiconductor device production comprises growing polysilicon film on surface of silicon wafer, and wet etching using mixture of ammonia water, hydrogen peroxide water and pure water
摘要 Production of a semiconductor device comprises growing a polysilicon film on the surface of a silicon wafer; and wet etching the film using a mixture of ammonia water, hydrogen peroxide water and pure water. Independent claims are also included for alternative processes for the production of the semiconductor device. Preferred Features: The temperature of the etching mixture is controlled.
申请公布号 DE10051604(A1) 申请公布日期 2001.06.07
申请号 DE20001051604 申请日期 2000.10.18
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO 发明人 ASAOKA, YASUHIRO;YOKOI, NAOKI
分类号 H01L21/306;H01L21/3213;(IPC1-7):H01L21/306;H01L21/321 主分类号 H01L21/306
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