发明名称 |
Semiconductor device production comprises growing polysilicon film on surface of silicon wafer, and wet etching using mixture of ammonia water, hydrogen peroxide water and pure water |
摘要 |
Production of a semiconductor device comprises growing a polysilicon film on the surface of a silicon wafer; and wet etching the film using a mixture of ammonia water, hydrogen peroxide water and pure water. Independent claims are also included for alternative processes for the production of the semiconductor device. Preferred Features: The temperature of the etching mixture is controlled.
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申请公布号 |
DE10051604(A1) |
申请公布日期 |
2001.06.07 |
申请号 |
DE20001051604 |
申请日期 |
2000.10.18 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO |
发明人 |
ASAOKA, YASUHIRO;YOKOI, NAOKI |
分类号 |
H01L21/306;H01L21/3213;(IPC1-7):H01L21/306;H01L21/321 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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