发明名称 INTEGRATED MEMORY CELL AND METHOD OF FABRICATION
摘要 A nonvolatile memory cell comprising a pair of spaced apart shallow trench isolation regions formed in a substrate and defining a substrate active region. A tunnel dielectric is formed on the substrate active region. A floating gate is formed on the tunnel dielectric and is self aligned between the spaced apart shallow trench isolation regions. A dielectric layer is formed on the floating gate and a control gate formed on the dielectric layer. A source region and a drain region are formed in the substrate active region on opposite sides of the floating gate.
申请公布号 WO0141199(A1) 申请公布日期 2001.06.07
申请号 WO2000US29001 申请日期 2000.10.18
申请人 INTEL CORPORATION;MIELKE, NEAL, R.;FAZIO, ALBERT;PARAT, KRISHNA;WADA, GLEN;STONE, REX 发明人 MIELKE, NEAL, R.;FAZIO, ALBERT;PARAT, KRISHNA;WADA, GLEN;STONE, REX
分类号 H01L21/285;H01L21/336;H01L21/60;H01L21/8247;H01L27/115;H01L29/788 主分类号 H01L21/285
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