发明名称 In-situ getter in process cavity of processing chamber
摘要 An apparatus for removing an undesirable gas in a processing chamber includes one or more getter materials disposed between a process gas inlet and a substrate support member in the processing chamber, and one or more temperature control elements disposed in thermal communication with the one or more getter materials. Preferably, a controller is connected to the one or more temperature control elements to regulate the temperature of the one or more getter materials, and a gas analyzer is disposed within the processing chamber to provide signals to the controller and indicate the presence of undesirable gases. Another aspect of the invention provides a method for removing a gas from a processing chamber comprising pumping the gas using a getter material disposed between a process gas inlet and a substrate support member in the processing chamber, wherein the getter material is activated by a temperature control element disposed in thermal communication with the getter material. Preferably, the method further comprises detecting a presence of the gas within the processing chamber and controlling the pumping of the getter material based on detection of the presence of the gas.
申请公布号 US6241477(B1) 申请公布日期 2001.06.05
申请号 US19990383119 申请日期 1999.08.25
申请人 APPLIED MATERIALS, INC. 发明人 BREZOCZKY THOMAS;HEYDER ROGER;DAVENPORT ROBERT E.
分类号 C23C14/56;F04B37/02;(IPC1-7):F04B37/02 主分类号 C23C14/56
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