发明名称 |
WAVELET ANALYSIS FOR LASER ULTRASONIC MEASUREMENT OF MATERIAL PROPERTIES |
摘要 |
A laser ultrasonics technique (18) is used to characterize a composite dispersive response signal from a sample under analysis, such as a semiconductor wafer (16). Rather than measuring individual accoustic wa ve velocities at specific frequencies, an entire dispersive response signal (fig. 8) is analyzed. In a presently preferred embodiment of this invention the entire dispersive response signal is analyzed using a wavelet-based technique (figs. 4a, 4b), such as dispersive wavelet transform analysis technique.
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申请公布号 |
CA2224189(C) |
申请公布日期 |
2001.06.05 |
申请号 |
CA19972224189 |
申请日期 |
1997.04.10 |
申请人 |
TEXTRON SYSTEMS CORPORATION |
发明人 |
KOTIDIS, PETROS A.;REICH, JUDITH |
分类号 |
G01B17/02;G01N29/00;G01N29/12;G01N29/24;G01N29/46;G01N29/50;G01N29/52;(IPC1-7):G01N29/00;G01K13/04;G01K11/22;G01R31/265;H01L21/66 |
主分类号 |
G01B17/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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