发明名称 |
RETICLE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING THE SAME |
摘要 |
PURPOSE: A reticle is provided to easily perform a planarization process regarding a substrate in a chemical mechanical polishing(CMP) process by forming a dummy pattern in an edge region of a wafer to prevent a step difference between a chip region and the edge region. CONSTITUTION: An edge region surrounds the first chip region and the second chip region. Reverse-U shape openings(20) connected to each other in a chain type are formed in the first chip region to form a dummy pattern. An opening for a pattern is formed in the second chip region.
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申请公布号 |
KR20010045203(A) |
申请公布日期 |
2001.06.05 |
申请号 |
KR19990048408 |
申请日期 |
1999.11.03 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GONG HWAN;KWON, WON TAEK |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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