发明名称 |
Wafer holding head and wafer polishing apparatus, and method for manufacturing wafers |
摘要 |
The present invention provides wafer polishing apparatus in which the wafer holding head comprises a diaphragm substantially vertically expanded to the head axis in the head body; a carrier, which is fixed to the diaphragm and provided so as to be able to displace along the head axis direction together with the diaphragm; a retainer fixed to the diaphragm in a concentric relation to the carrier; a pressure adjusting mechanism for controlling the pressure of a fluid chamber formed between the diaphragm and the head body; a plurality of carrier torque mechanisms provided between the head body and the carrier for communicating the torque of the head body to the carrier; a plurality of first sensors, which is provided at individual torque transfer mechanism, for observing the force along the direction of rotation acting on the wafer; and a processor, which is connected to each first sensor, for calculating the force acting on the wafer based on the output from these first sensors.
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申请公布号 |
US6242353(B1) |
申请公布日期 |
2001.06.05 |
申请号 |
US20000525322 |
申请日期 |
2000.03.13 |
申请人 |
MITSUBISHI MATERIALS CORPORATION |
发明人 |
KOBAYASHI TATSUNORI;TANAKA HIROSHI;RIKITA NAOKI |
分类号 |
B24B37/04;B24B37/30;B24B37/32;B24B41/06;B24B49/16;H01L21/306;(IPC1-7):H01L21/00 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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