发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to guarantee sufficient capacitance while obtaining an excellent electrical characteristic, by improving a deposition process for forming a Ta2O5 thin film used as a dielectric layer of the capacitor to make a thin film having a large dielectric constant and a stable structure. CONSTITUTION: A lower electrode(13) is formed on a substrate(11) having various elements for forming a semiconductor device. An amorphous (Ta2O5)1-x -(TiO2)x dielectric layer(15) is formed on the lower electrode. An upper electrode(16) is formed on the (Ta2O5)1-x -(TiO2)x dielectric layer.
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申请公布号 |
KR20010045961(A) |
申请公布日期 |
2001.06.05 |
申请号 |
KR19990049502 |
申请日期 |
1999.11.09 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, DONG JUN;LEE, GI JEONG |
分类号 |
C23C16/40;H01L21/02;H01L21/316;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
C23C16/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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