发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to guarantee sufficient capacitance while obtaining an excellent electrical characteristic, by improving a deposition process for forming a Ta2O5 thin film used as a dielectric layer of the capacitor to make a thin film having a large dielectric constant and a stable structure. CONSTITUTION: A lower electrode(13) is formed on a substrate(11) having various elements for forming a semiconductor device. An amorphous (Ta2O5)1-x -(TiO2)x dielectric layer(15) is formed on the lower electrode. An upper electrode(16) is formed on the (Ta2O5)1-x -(TiO2)x dielectric layer.
申请公布号 KR20010045961(A) 申请公布日期 2001.06.05
申请号 KR19990049502 申请日期 1999.11.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, DONG JUN;LEE, GI JEONG
分类号 C23C16/40;H01L21/02;H01L21/316;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 C23C16/40
代理机构 代理人
主权项
地址