发明名称 ELECTRON CYCLOTRON RESONANCE ASHING APPARATUS FOR PROCESSING GLASS SUBSTRATE OR WAFER
摘要 PURPOSE: An electron cyclotron resonance(ECR) ashing apparatus for processing a glass substrate or wafer is provided to perform a dry ashing process of high efficiency, by fixing the glass substrate of a large area or wafer and by driving a plurality of small ECR sources back and forth or right and left, and by disposing the small ECR sources and driving the glass substrate of a large area or wafer back and forth or right and left. CONSTITUTION: An induction hole for an object, an ashing gas exhausting hole and a gas supplying unit(115) are formed in an ashing chamber(100). The object applied with photoresist(111) is settled in a lower electrode(117) of the ashing chamber. A radio frequency(RF) power is applied to the lower electrode. An electron cyclotron resonance(ECR) source(123) forms plasma in the ashing chamber, composed of a microwave generating unit, a waveguide, a plasma discharging chamber and a magnetic coil. A power supplying apparatus(121) applies power to the ECR source. A scan apparatus(125) drives the ECR source to move back and forth or right and left.
申请公布号 KR20010044059(A) 申请公布日期 2001.06.05
申请号 KR20000036461 申请日期 2000.06.29
申请人 DISPLAY MANUFACTURING SERVICE CO., LTD. 发明人 BAE, U GYEONG;PARK, YONG SEOK
分类号 G03F7/42;G02F1/13;H01L21/00;H01L21/027;H01L21/30;H01L21/302;H01L21/304;H01L21/3065;H01L21/84;(IPC1-7):H01L21/304 主分类号 G03F7/42
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