发明名称 Self-aligning poly 1 ono dielectric for non-volatile memory
摘要 Non-volatile memory semiconductor device manufacturing throughput is increased by simultaneously patterning the floating gate layer and dielectric layer formed thereon. Embodiments include forming sidewall dielectric layers joined with one of the isolation insulating regions to enhance insulation of the floating gate electrode.
申请公布号 US6242773(B1) 申请公布日期 2001.06.05
申请号 US19980163310 申请日期 1998.09.30
申请人 ADVANCED MICRO DEVICES, INC. 发明人 THOMAS JACK F.
分类号 H01L21/28;H01L29/423;H01L29/51;(IPC1-7):H01L29/788;H01L29/76 主分类号 H01L21/28
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