发明名称 CHEMICAL MECHANICAL POLISHING APPARATUS HAVING MULTIPLE POLISHING PADS
摘要 PURPOSE: A chemical mechanical polishing(CMP) apparatus having a plurality of polishing pads is provided to improve reliability of a CMP process, by simultaneously polishing a plurality of wafers by using the polishing pad while guaranteeing uniformity of the polishing process. CONSTITUTION: A plurality of polishing platens can rotate at a predetermined rate, disposed near each other and having the same horizontal level. A plurality of polishing pads(30a,30b,30c) are in contact with a wafer(42a,42b,42c) to polish a wafer, fixed to the upper portion of the polishing platens. A plurality of wafer transfer units moves the wafer over the polishing pads to uniformly polish the surface of the wafer while holding the wafer in contact with the polishing pad.
申请公布号 KR20010045994(A) 申请公布日期 2001.06.05
申请号 KR19990049552 申请日期 1999.11.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWAK, BYEONG HO
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
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