发明名称 Double pass etalon spectrometer
摘要 A double pass etalon based spectrometer. Spectral components of a diffused beam are angularly separated as they are transmitted through an etalon. A retroreflector reflects the transmitted components back through the etalon. Twice transmitted spectral components are focused onto a light detector which in a preferred embodiment is a photo diode array. The spectrometer is very compact producing precise fringe data permitting bandwidth measurements with precision needed for microlithography for both DELTAlambdFWHM and DELTAlambd95%.
申请公布号 US6243170(B1) 申请公布日期 2001.06.05
申请号 US19990245134 申请日期 1999.02.04
申请人 CYMER, INC. 发明人 ERSHOV ALEXANDER I.
分类号 G01J3/26;G01B9/02;G01J1/00;G01J3/00;G01J3/02;G01J3/12;G01J3/28;(IPC1-7):G01B9/02 主分类号 G01J3/26
代理机构 代理人
主权项
地址