发明名称 WAFER PROTECTION RING HAVING IMPROVED TOLERANCE REGARDING THERMAL SHOCK AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A method for manufacturing a wafer protection ring having improved tolerance regarding a thermal shock is provided to prevent the wafer protection ring from being transformed by a rapid temperature change or to prevent the wafer protection ring from being broken down by thermal fatigue, by installing a silicon oxide layer having strong tolerance on the surface of the wafer protection ring. CONSTITUTION: A ceramic ring is composed of a mixture of SiC and Si3N4 or only SiC. The surface of the ceramic ring is polished in a circumferential direction. The ceramic ring is sintered within a temperature scope from 1350 deg.C to 1450 deg.C and in an oxygen atmosphere so that a silicon oxide layer is formed on the surface of the ceramic ring. The ceramic ring is cooled down to 500 deg.C and to a room temperature.
申请公布号 KR20010045895(A) 申请公布日期 2001.06.05
申请号 KR19990049407 申请日期 1999.11.09
申请人 KORNIC SYSTEMS CORP. 发明人 CHOI, YONG JEONG
分类号 H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/68
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