发明名称 |
THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A thin film transistor is provided to prevent a characteristic of a channel layer from being degraded by an etch process, by forming an ohmic contact layer of a spacer type on the sidewalls of source and drain electrodes, and by disposing a channel layer between the source and drain electrodes including the ohmic contact layer. CONSTITUTION: A source electrode(12a) and a drain electrode(12b) are formed on a transparent insulating substrate(11), separated from each other. Ohmic contact layers(13a) of a spacer type are formed on the sidewalls of the source and drain electrodes, respectively. A channel layer(14a) is formed on the transparent insulating substrate between the ohmic contact layers. A gate insulating layer(15) is formed on the resultant structure. A gate is formed on the gate insulating layer portion formed on the channel layer.
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申请公布号 |
KR20010046041(A) |
申请公布日期 |
2001.06.05 |
申请号 |
KR19990049623 |
申请日期 |
1999.11.10 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, SEONG UK;PARK, HAE SEONG |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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