发明名称 |
ETCHING METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: An etching method for manufacturing a semiconductor device is provided to improve a profile of a pattern, by efficiently eliminating the polymer generated in a process for etching an oxynitride layer. CONSTITUTION: An oxide layer(12), a poly layer and an oxynitride layer(16) are sequentially formed on a semiconductor substrate(10) to form a thin film structure. The thin film structure is etched by an in-situ method. After the oxynitride layer is etched, polymer is eliminated by using mixture gas of helium and oxygen before the poly layer is etched.
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申请公布号 |
KR20010044889(A) |
申请公布日期 |
2001.06.05 |
申请号 |
KR19990047939 |
申请日期 |
1999.11.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN, JUN HO |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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