发明名称 ETCHING METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: An etching method for manufacturing a semiconductor device is provided to improve a profile of a pattern, by efficiently eliminating the polymer generated in a process for etching an oxynitride layer. CONSTITUTION: An oxide layer(12), a poly layer and an oxynitride layer(16) are sequentially formed on a semiconductor substrate(10) to form a thin film structure. The thin film structure is etched by an in-situ method. After the oxynitride layer is etched, polymer is eliminated by using mixture gas of helium and oxygen before the poly layer is etched.
申请公布号 KR20010044889(A) 申请公布日期 2001.06.05
申请号 KR19990047939 申请日期 1999.11.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, JUN HO
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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