发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE WHICH CAN REDUCE READ TIME
摘要 PURPOSE: A nonvolatile semiconductor memory device is provided to reduce a read time to improve an operation speed by discharging node voltage to required voltage quickly . CONSTITUTION: The nonvolatile semiconductor memory device includes: an array(10) of memory cells arranged in cross regions of word lines and bit lines(BL0-BL1023); a plurality of load transistors(41) which are connected to the bit lines respectively and supply a load current to the corresponding bit lines during a read operation; and a load control circuit(100) controlling a voltage to be applied to a node(A0) where gates of the load transistors are connected in common, during the read operation. The load control circuit includes: the first discharge part(120) discharging a voltage of the node in response to a sense activation signal during the read operation; a target voltage generation part(160) generating a target voltage to be set to the node in response to the sense activation signal; a comparison part(180) generating a comparison signal by detecting whether the voltage of the node is higher than the target voltage; and the second discharge part(140) discharging the voltage of the node in response to the comparison part. Each memory cell includes an electrically erasable programmable read only memory(EEPROM) cell transistor.
申请公布号 KR20010044901(A) 申请公布日期 2001.06.05
申请号 KR19990047958 申请日期 1999.11.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON, SEOK CHEON;LEE, SEOK HEON
分类号 G11C16/06;G11C8/08;G11C16/02;G11C16/08;(IPC1-7):G11C16/02 主分类号 G11C16/06
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