发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE WHICH CAN REDUCE READ TIME |
摘要 |
PURPOSE: A nonvolatile semiconductor memory device is provided to reduce a read time to improve an operation speed by discharging node voltage to required voltage quickly . CONSTITUTION: The nonvolatile semiconductor memory device includes: an array(10) of memory cells arranged in cross regions of word lines and bit lines(BL0-BL1023); a plurality of load transistors(41) which are connected to the bit lines respectively and supply a load current to the corresponding bit lines during a read operation; and a load control circuit(100) controlling a voltage to be applied to a node(A0) where gates of the load transistors are connected in common, during the read operation. The load control circuit includes: the first discharge part(120) discharging a voltage of the node in response to a sense activation signal during the read operation; a target voltage generation part(160) generating a target voltage to be set to the node in response to the sense activation signal; a comparison part(180) generating a comparison signal by detecting whether the voltage of the node is higher than the target voltage; and the second discharge part(140) discharging the voltage of the node in response to the comparison part. Each memory cell includes an electrically erasable programmable read only memory(EEPROM) cell transistor.
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申请公布号 |
KR20010044901(A) |
申请公布日期 |
2001.06.05 |
申请号 |
KR19990047958 |
申请日期 |
1999.11.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KWON, SEOK CHEON;LEE, SEOK HEON |
分类号 |
G11C16/06;G11C8/08;G11C16/02;G11C16/08;(IPC1-7):G11C16/02 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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