发明名称 METHOD FOR MANUFACTURING METAL INTERCONNECTION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a metal interconnection of a semiconductor device is provided to transform a void of a circular shape into a void of a silt shape and to prevent the void from growing. CONSTITUTION: An interlayer dielectric(22) is formed on a semiconductor substrate(21). An alloy layer in which solute metal having an affinity for nitrogen is mixed with solute metal having a relatively low affinity for nitrogen, is formed on the interlayer dielectric. A heat treatment is performed in a nitrogen atmosphere regarding the semiconductor substrate to form a plurality of metal nitride deposits having a size smaller than nanometer inside the alloy layer. The alloy layer having the metal nitride deposits is selectively removed to form a metal interconnection(26).
申请公布号 KR20010044930(A) 申请公布日期 2001.06.05
申请号 KR19990047990 申请日期 1999.11.01
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, CHANG YONG;KIM, YEONG CHEOL
分类号 H01L21/3205;(IPC1-7):H01L21/320 主分类号 H01L21/3205
代理机构 代理人
主权项
地址