发明名称 |
METHOD FOR MANUFACTURING METAL INTERCONNECTION OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a metal interconnection of a semiconductor device is provided to transform a void of a circular shape into a void of a silt shape and to prevent the void from growing. CONSTITUTION: An interlayer dielectric(22) is formed on a semiconductor substrate(21). An alloy layer in which solute metal having an affinity for nitrogen is mixed with solute metal having a relatively low affinity for nitrogen, is formed on the interlayer dielectric. A heat treatment is performed in a nitrogen atmosphere regarding the semiconductor substrate to form a plurality of metal nitride deposits having a size smaller than nanometer inside the alloy layer. The alloy layer having the metal nitride deposits is selectively removed to form a metal interconnection(26).
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申请公布号 |
KR20010044930(A) |
申请公布日期 |
2001.06.05 |
申请号 |
KR19990047990 |
申请日期 |
1999.11.01 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KANG, CHANG YONG;KIM, YEONG CHEOL |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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