发明名称 POLISHING PAD AND POLISHING METHOD
摘要 PROBLEM TO BE SOLVED: To perform uniform polishing and high-speed and high-pressure polishing and to improve using efficiency of slurry. SOLUTION: In this polishing pad 1 having a pad body 2 for pressing and rotationally polishing a semiconductor wafer W, many recessed grooves 4a to 4c in which slurry flows are formed on the pad body 2 so as to intersect to one another, many projecting parts 5a to 5c aligned longitudinally and laterally on the flat surface and having plane regular hexagonal shapes are provided, and one projecting part out of the projecting parts 5a to 5c is arranged in the longitudinal positions of respective recessed grooves 4a to 4c.
申请公布号 JP2001150332(A) 申请公布日期 2001.06.05
申请号 JP19990331535 申请日期 1999.11.22
申请人 NEC CORP 发明人 TSUCHIYA YASUAKI
分类号 B24B37/20;B24B37/26;B24D13/14;H01L21/304 主分类号 B24B37/20
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