| 摘要 |
The invention relates to an arrangement for and a method of measuring and adjusting the bias current (Ib) in transistors (28) used in class AB or class B type amplifiers (30), characterised by the steps of repetitively measuring (110) the bias current (Ib) during operation without interrupting the normal transmission for the power amplifier (30), and repetitively adjusting (200) the bias current (Ib) during operation thus keeping it stable over time and temperature. |
